母線槽故障回路電阻試驗(yàn)中試驗(yàn)電流對(duì)試驗(yàn)結(jié)果的影響
龐佳，張正，馬國(guó)浩
（浙江方圓電氣設(shè)備檢測(cè)有限公司，浙江 嘉興 314001）
摘 要：針對(duì)母線槽故障零序電阻試驗(yàn)中試驗(yàn)電流對(duì)試驗(yàn)結(jié)果的影響，通過(guò)對(duì)同一根母線槽通以額定電流以及3倍的額定電流，經(jīng)過(guò)計(jì)算得到故障零序電阻，并對(duì)其進(jìn)行分析，結(jié)果表明，母線槽的故障零序電阻試驗(yàn)中的試驗(yàn)電流為額定電流會(huì)更加合理些，為供電系統(tǒng)中正確選用合適的母線槽提供參考與依據(jù)。
關(guān)鍵詞：母線槽；故障零序電阻；電抗；額定電流
中圖分類(lèi)號(hào)：TM645.1+2 文獻(xiàn)標(biāo)識(shí)碼：B 文章編號(hào)：1007-3175(2018)03-0057-03
Influence of Test Current on Test Results in Resistance Test of Busway Fault Circuit
PANG Jia, ZHANG Zheng, MA Guo-hao
（Zhejiang Fangyuan Electrical Equipment Inspection Co., Ltd, Jiaxing 314001, China）
Abstract: Aiming at the influence of test current on test results in zero sequence resistance test of busway faults, this paper calculated the fault zero sequence resistance which was tested for the same busbar under the conditions of rated current and three times of rated current and analyzed the fault zero sequence resistance. The results show that the rated current in fault zero sequence resistance test of busbar will be more reasonable, which provides reference and basis for the selection of suitable busbar in power supply system.
Key words: busway; fault-loop zero-sequence resistance; reactance; rated curren
參考文獻(xiàn)
[1] GB 7251.6—2015 低壓成套開(kāi)關(guān)設(shè)備和控制設(shè)備 第6 部分：母線干線系統(tǒng)( 母線槽)[S].
[2] GB 7251.2—2006 低壓成套開(kāi)關(guān)設(shè)備和控制設(shè)備 第2部分：對(duì)母線干線系統(tǒng)( 母線槽) 的特殊要求[S].
