新型短路測(cè)試裝置的研制
陳西
（蘇州西門(mén)子電器有限公司，江蘇 蘇州 215129）
摘 要：低壓斷路器在研發(fā)階段需要做大量的短路試驗(yàn)來(lái)驗(yàn)證其在短路條件下的接通分?jǐn)嗄芰?。?guó)家標(biāo)準(zhǔn)中定義的短路試驗(yàn)操作順序?yàn)?ldquo;O—t—CO—t—CO”，其中t 至少為3 min。為了縮短研發(fā)測(cè)試時(shí)間，研發(fā)了一種半自動(dòng)化高效率的短路測(cè)試裝置，該裝置能有效地避開(kāi)等待時(shí)間提高測(cè)試效率。給出了該裝置的結(jié)構(gòu)圖并分析了其高效的工作原理。經(jīng)性能測(cè)試表明，該裝置大大地提高了測(cè)試效率，其對(duì)低壓斷路器的研發(fā)有一定的意義。
關(guān)鍵詞：小型斷路器；短路試驗(yàn)；操作順序；等待時(shí)間
中圖分類(lèi)號(hào)：TM561 文獻(xiàn)標(biāo)識(shí)碼：A 文章編號(hào)：1007-3175(2020)11-0066-03
New Short-Circuit Test Facility Manufacture
CHEN Xi
（Siemens Electrical Apparatus Ltd, Suzhou 215129, China）
Abstract: A lot of short-circuit tests are implemented to verify the short-circuit making and breaking capability during low voltage apparatus research and development. The short-circuit test operation sequence defined in national standard is “O — t — CO — t — CO ”, the waiting time is 3 minutes at least. Traditionally, a lot of samples are used to test and one test sample one time, this means needing more test time. Based on this situation, one semi-automatic high efficiency short-circuit test equipment was developed to avoid the waiting time. The structure diagram is given and principles of high efficiency are analyzed. The test result shows this equipment can improve test efficiency; it is meaningful for low voltage apparatus research and development.
Key words: miniature circuit breaker; short-circuit test; operation sequence; waiting time
參考文獻(xiàn)
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[2] 中國(guó)電器工業(yè)協(xié)會(huì). 低壓開(kāi)關(guān)設(shè)備和控制設(shè)備 第2部分：斷路器：GB 14048.2—2008[J]. 北京：中國(guó)標(biāo)準(zhǔn)出版社，2009：26-27.
