Suzhou Electric Appliance Research Institute
期刊號: CN32-1800/TM| ISSN1007-3175

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電子式漏電斷路器雙應(yīng)力加速退化試驗方案研究

來源:電工電氣發(fā)布時間:2022-05-28 08:28 瀏覽次數(shù):481

電子式漏電斷路器雙應(yīng)力加速退化試驗方案研究

趙興洲,繆建華,王澤,李想
(河北工業(yè)大學(xué) 電氣工程學(xué)院,天津 300130)
 
    摘 要:漏電斷路器屬于高可靠性、長壽命產(chǎn)品,在短時間內(nèi)無法獲取足夠的失效數(shù)據(jù)對其可靠性進(jìn)行評估。在不改變漏電斷路器失效機理的條件下,提出了雙應(yīng)力交叉步進(jìn)加速退化試驗方案,通過分析漏電斷路器的失效機理,確定溫度、濕度作為加速應(yīng)力,選擇雙應(yīng)力交叉步進(jìn)的應(yīng)力加載方式;根據(jù) Peck 模型中加速因子的計算,選擇應(yīng)力組合方案,通過摸底試驗選擇性能退化特征量,并確定了試驗樣品數(shù)量、試驗周期等試驗參數(shù),制定出試驗程序。該方案有效解決了電子式漏電斷路器可靠性評估試驗樣本多和試驗時間長的問題。
    關(guān)鍵詞:電子式漏電斷路器;Peck 模型;失效機理;加速因子
    中圖分類號:TM561     文獻(xiàn)標(biāo)識碼:B     文章編號:1007-3175(2022)05-0053-05
 
Research on Accelerated Degradation Test Scheme with Two Accelerating
Stresses of Electronic Leakage Circuit Breaker
 
ZHAO Xing-zhou, MIAO Jian-hua, WANG Ze, LI Xiang
(School of Electrical Engineering, Hebei University of Technology, Tianjin 300130, China)
 
    Abstract: Residual current circuit breakers are highly reliable and long-life products and therefore it is impossible to obtain sufficient failure data to evaluate their reliability in a short period.This paper proposed a dual-stress cross-step accelerated degradation test scheme under the condition of not changing the failure mechanism of the leakage circuit breaker.It analyzed the failure mechanism of the leakage circuit breaker and determined the temperature and humidity as the acceleration stress. Moreover, it selected the stress loading mode of double stress cross-stepping.This research chose the stress combination scheme according to the calculation of the acceleration factor in the Peck model,elected the characteristic quantity of performance degradation through the bottom-up test. It determined the testing parameter, such as the number of test samples and the test period. Besides, it formulated the test program.This study effectively solves the problems which excessive test samples and tediously long testing time for reliability evaluation of electronic leakage circuit breakers.
    Key words: electronic leakage circuit breaker; Peck model; failure mechanism; acceleration factor
 
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