Suzhou Electric Appliance Research Institute
期刊號(hào): CN32-1800/TM| ISSN1007-3175

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帶并聯(lián)電抗器的雙回輸電線路故障測(cè)距新方法

來(lái)源:電工電氣發(fā)布時(shí)間:2023-03-31 13:31 瀏覽次數(shù):356

帶并聯(lián)電抗器的雙回輸電線路故障測(cè)距新方法

張帥,李澄,嚴(yán)棟
(國(guó)網(wǎng)江蘇省電力有限公司無(wú)錫供電分公司, 江蘇 無(wú)錫 214000)
 
    摘 要:為解決帶并聯(lián)電抗器輸電線路兩側(cè)電流變化和線路參數(shù)不固定產(chǎn)生的故障測(cè)距誤差問(wèn)題,提出了一種雙回輸電線路故障測(cè)距新方法。采用集中參數(shù)線路模型分析正序、負(fù)序、零序故障網(wǎng)絡(luò),推導(dǎo)出與線路單位長(zhǎng)度阻抗、導(dǎo)納以及并聯(lián)電抗器電抗值均無(wú)關(guān)的故障距離表達(dá)式。由線路分相電流差動(dòng)保護(hù)裝置縱向通道和橫向通道獲取四側(cè)同步的模擬量數(shù)據(jù),通過(guò)調(diào)整保護(hù)裝置的插件功能模塊研制出故障測(cè)距裝置。裝置試驗(yàn)結(jié)果表明,新方法的測(cè)距精度高于裝置原有的方法,能解決線路兩側(cè)帶并聯(lián)電抗器和線路參數(shù)變化引起的測(cè)距誤差問(wèn)題,且經(jīng)過(guò)渡電阻故障時(shí)仍具有較高的測(cè)距精度。
    關(guān)鍵詞: 并聯(lián)電抗器;線路參數(shù);橫向通道;故障測(cè)距
    中圖分類號(hào):TM472 ;TM773     文獻(xiàn)標(biāo)識(shí)碼:A     文章編號(hào):1007-3175(2023)03-0047-08
 
A New Fault Location Method of Double-Circuit Transmission
Lines with Parallel Reactors
 
ZHANG Shuai, LI Cheng, YAN Dong
(Wuxi Power Supply Company of State Grid Jiangsu Electric Power Co., Ltd, Wuxi 214000, China)
 
    Abstract: In order to deal with fault location caused by current changes occurring to both sides of transmission lines with parallel reactors and unfixed line parameters, a new fault location method of double-circuit transmission lines is put forward. The paper adopts the lump parameter circuit model to analyze positive sequence, negative sequence and zero sequence fault networks, and generates the fault location expression which is irrelevant to line impedance and admittance per unit and the reactance value of parallel reactors. Then, after achieving four-side synchronized analog data from longitudinal and horizontal channels of the phase segregated current differential protection device,the authors invent the fault location device through adjusting the plug-in function module of this protection device. Test results show that this new method of fault location is more accurate than the old one. It not only can solve the problem of location error caused by changes of parallel reactors and line parameters, but also can have higher ranging accuracy when passing transition resistance faults.
    Key words: parallel reactor; line parameter; horizontal channel; fault location device
 
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