Suzhou Electric Appliance Research Institute
期刊號(hào): CN32-1800/TM| ISSN1007-3175

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便攜式絕緣電阻測(cè)試儀的設(shè)計(jì)

來源:電工電氣發(fā)布時(shí)間:2016-03-10 13:10 瀏覽次數(shù):11

便攜式絕緣電阻測(cè)試儀的設(shè)計(jì) 

陳杏燦,程漢湘,彭湃,冼冀 
(廣東工業(yè)大學(xué) 自動(dòng)化學(xué)院,廣東 廣州 510006) 
 

摘 要: 針對(duì)電器設(shè)備隨著環(huán)境的變化與壽命的減少,其絕緣水平將降低的現(xiàn)狀。設(shè)計(jì)了以STC12C5A60S2 單片機(jī)為控制核心,簡(jiǎn)易的高頻開關(guān)電源做500 V 測(cè)量電源,采用串聯(lián)法的絕緣電阻測(cè)試儀。給出了系統(tǒng)原理及軟硬件設(shè)計(jì)流程,通過試驗(yàn)表明,該測(cè)試儀具有穩(wěn)定的高壓輸出、測(cè)試誤差在5%以內(nèi)、操作簡(jiǎn)單以及成本低廉等優(yōu)點(diǎn)。
關(guān)鍵詞: 絕緣電阻;單片機(jī);開關(guān)電源;串聯(lián)法
中圖分類號(hào):TM934.3 文獻(xiàn)標(biāo)識(shí)碼:A 文章編號(hào):1007-3175(2015)07-0046-04


Design of Portable Insulation Resistance Tester 

CHEN Xing-can, CHENG Han-xiang, PENG Pai, XIAN Ji 
(College of Automation, Guangdong University of Technology, Guangzhou 510006, China) 
 

Abstract: Aiming at the actuality that the electrical equipment will cut lifespan with the change of environment and insulation level will reduce, this paper designed a simple high frequency switching power supply as the 500 V testing power supply with microcontroller STC12C5A60S2 as the controlling core. The insulation resistance tester with series process was adopted and the system principle and the flowchart of software and hardware were given. The experiment shows that the tester has many advantages, such as stable high-voltage output, test error within five percent, easy operation and low costs.
Key words: insulated resistance; microcontroller; switching power supply; series process


參考文獻(xiàn)
[1] 賈志東,白偉利,姚森敬,楊翠茹. 憎水性清潔劑對(duì)電氣設(shè)備外絕緣的影響[J]. 高電壓技術(shù),2012,38(9):2403-2409.
[2] 馬暉,楊會(huì)民,陳珺,等.絕緣電阻及其測(cè)量[J].儀器儀表標(biāo)準(zhǔn)化與計(jì)量,2009(4):43-44.
[3] 郭剛.淺談醫(yī)用設(shè)備的絕緣電阻測(cè)量[J].醫(yī)療設(shè)備信息,2010,25(5):52-53.
[4] 李健.絕緣電阻測(cè)試儀的設(shè)計(jì)[D].大連:大連理工大學(xué),2006.
[5] 喬楠楠.數(shù)字絕緣電阻測(cè)試儀的設(shè)計(jì)與應(yīng)用[D].成都:成都理工大學(xué),2012.
[6] 婁會(huì)超,戴新生,萬少松.多路絕緣電阻自動(dòng)檢測(cè)儀設(shè)計(jì)[J].計(jì)算機(jī)測(cè)量與控制,2003,11(8):635-637.
[7] 羅大成, 王仕成, 曾洪貴, 等. 導(dǎo)彈絕緣電阻自動(dòng)化測(cè)試系統(tǒng)的設(shè)計(jì)[J]. 電光與控制,2007,14(3):126-130.
[8] 李智威,李化,楊佩厚,等. 不同場(chǎng)強(qiáng)下金屬化聚丙烯膜電容器泄漏特性[J]. 電工技術(shù)學(xué)報(bào),2013,28(9):274-280.
[9] 馬春排,張?jiān)幢?絕緣電阻數(shù)字化測(cè)量的研究[J].中國(guó)儀器儀表,2002(1):7-10.
[10] 張海藩.軟件工程[M].北京:人民郵電出版社,2010.