Suzhou Electric Appliance Research Institute
期刊號: CN32-1800/TM| ISSN1007-3175

Article retrieval

文章檢索

首頁 >> 文章檢索 >> 往年索引

低壓成套開關(guān)設(shè)備內(nèi)部故障電弧研究

來源:電工電氣發(fā)布時間:2016-11-17 13:17 瀏覽次數(shù):5
低壓成套開關(guān)設(shè)備內(nèi)部故障電弧研究
 
林承志1,蘇金州1,2,張學軍1,謝宏靈1
(1 福建省產(chǎn)品質(zhì)量檢驗研究院,福建 福州 350002;2 福州大學,福建 福州 350108)
 
    摘 要:介紹了低壓成套開關(guān)設(shè)備內(nèi)部故障電弧,結(jié)合標準GB/Z 18859—2002 及IEC/TR 61641,對低壓成套開關(guān)設(shè)備進行內(nèi)部故障引弧試驗并對試驗現(xiàn)象進行分析,闡述了引起內(nèi)部故障電弧的原因,通過對樣機進行合理優(yōu)化改造設(shè)計,并采取了必要的故障電弧防護措施,使得順利通過試驗,為通過引弧試驗提供了參考。
    關(guān)鍵詞:低壓成套開關(guān)設(shè)備;故障電??;引弧試驗;改造設(shè)計;防護措施
    中圖分類號:TM591     文獻標識碼:A     文章編號:1007-3175(2016)11-0044-03
 
Study on Internal Fault Arc of Low-Voltage Switchgear Assemblies
 
LIN Cheng-zhi1, SU Jin-zhou1, 2, ZHANG Xue-jun1, XIE Hong-ling1
(1 Fujian Inspection and Research Institute for Product Quality, Fuzhou 350002, China;
2 Fuzhou University, Fuzhou 350108, China)
 
    Abstract: Introduction was made to the internal fault arc of low-voltage switchgear assemblies. Combining with the standard of GB/Z 18859----2002and IEC/TR 61641, this paper carried out the internal fault arc ignition test of low-voltage switchgear assemblies and analyzed its test phenomenon. This paper expounded the cause of internal fault arc. The prototype was optimized and designed. The system carried out the necessary fault arc preventive measures to sweep through the test, which provides references for the arc ignition test.
    Key words: low-voltage switchgear assembly; fault arc; arc ignition test; reconstruction design; preventive measure
 
參考文獻
[1] 田廣青. 中低壓開關(guān)柜內(nèi)部故障電弧光保護系統(tǒng)[J]. 電工技術(shù),2004(10):62-64.
[2] IEC/TR61643—2008 Enclosed low-voltage switchgear and controlgear assemblies—Guide for testing under conditions of arcing due to internal fault[S].
[3] GB/Z 18859—2002 封閉式低壓成套開關(guān)設(shè)備和控制設(shè)備在內(nèi)部故障引起電弧情況下的試驗導則[S].
[4] 蔡彬,陳德桂. 中壓開關(guān)柜中內(nèi)部電弧故障的計算方法和防護措施[J]. 高壓電器,2003,39(1):8-11.
[5] 李建基. 開關(guān)設(shè)備中的故障電弧及其防護[J]. 電力設(shè)備,2004,5(3):41-43.