Suzhou Electric Appliance Research Institute
期刊號: CN32-1800/TM| ISSN1007-3175

Article retrieval

文章檢索

首頁 >> 文章檢索 >> 往年索引

一起非電量保護裝置誤動原因分析與改進

來源:電工電氣發(fā)布時間:2017-04-21 09:21 瀏覽次數(shù):8
一起非電量保護裝置誤動原因分析與改進
 
陳強林,張鋒,劉曉航,馮佳奇
(許繼電氣股份有限公司,河南 許昌 461000)
 
    摘 要:分析了一起非電量保護裝置誤動事件,對故障現(xiàn)象、數(shù)據(jù)的分析過程進行了闡述,采用了軟、硬件故障模擬方法,最終確定誤動原因是由于裝置CPU 插件RAM 內(nèi)存中一位數(shù)據(jù)出錯而引起保護邏輯變化,滿足動作條件而誤出口,并從增加閉鎖相關保護功能、使用雙CPU 配置、增加重要自檢信息的事件記錄等方面對類似故障發(fā)生時的閉鎖及后續(xù)改進提供了方法。
    關鍵詞:非電量保護;誤動;翻轉故障;軟件閉鎖
    中圖分類號:TM77     文獻標識碼:B     文章編號:1007-3175(2017)04-0040-03
 
Cause Analysis and Improvement of a Case of Non-Electric Quantity Protection Device Misoperation
 
CHEN Qiang-lin, ZHANG Feng, LIU Xiao-hang, FENG Jia-qi
(XJ Electric Co., Ltd, Xuchang 461000, China)
 
    Abstract: This paper analyzed an incident of non-electric quantity protection device misoperation, expounded the analysis procedure of fault phenomenon and data, and adopted the software and hardware fault simulation method. The final determination misoperation cause was the protection logic changes caused by the data error in the plug-in random-access memory (RAM) of device central processing unit (CPU) to meet the movement condition and mis-export. This paper started from the incident records such as increasing the protection function related to interlock, using double CPU configuration, increasing important self-inspection information etc. to provide the methods for the atresia of similar failure and subsequent improvement.
    Key words: non-electric quantity protection; misoperation; reversal fault; software interlock
 
參考文獻
[1] 杜永良,高亞奎. 機載計算機RAM 故障診斷技術[J].測控技術,2015,34(22):66-69.
[2] 高潔. 常見繼電保護誤動作產(chǎn)生的原因及預防措施分析[J]. 電子世界,2016(20):181-183.